ATLAS Offline Software
Enumerations
SCT_ConditionsData Namespace Reference

Enumerations

enum  NumberOfElements {
  SIDES_PER_MODULE =2, NUMBER_OF_MODULES =4088, NUMBER_OF_WAFERS =NUMBER_OF_MODULES*SIDES_PER_MODULE, CHIPS_PER_SIDE =6,
  CHIPS_PER_MODULE =SIDES_PER_MODULE*CHIPS_PER_SIDE, STRIPS_PER_WAFER =768, STRIPS_PER_CHIP =STRIPS_PER_WAFER/CHIPS_PER_SIDE
}
 
enum  NumberOfCalibrationData { N_NPTGAIN =6, N_NOISEOCC =4 }
 
enum  MajorityParameters {
  HighAndLowVoltageOK =17, OVERALL =110, BARREL =111, ECA =114,
  ECC =115, N_REGIONS =4, INDEX_HVfraction =1, INDEX_MajorityState =3
}
 
enum  Bec { bec_ECC =-2, bec_BARREL =0, bec_ECA =+2 }
 

Enumeration Type Documentation

◆ Bec

Enumerator
bec_ECC 
bec_BARREL 
bec_ECA 

Definition at line 31 of file SCT_ConditionsParameters.h.

31 {bec_ECC=-2, bec_BARREL=0, bec_ECA=+2};

◆ MajorityParameters

Enumerator
HighAndLowVoltageOK 
OVERALL 
BARREL 
ECA 
ECC 
N_REGIONS 
INDEX_HVfraction 
INDEX_MajorityState 

Definition at line 23 of file SCT_ConditionsParameters.h.

23  {HighAndLowVoltageOK=17, /* 17 = 0x11 -> majority state for both LV and HV. */
24  OVERALL=110,
25  BARREL=111,
26  ECA=114,
27  ECC=115,
28  N_REGIONS=4,

◆ NumberOfCalibrationData

Enumerator
N_NPTGAIN 
N_NOISEOCC 

Definition at line 22 of file SCT_ConditionsParameters.h.

22 {N_NPTGAIN=6, N_NOISEOCC=4};

◆ NumberOfElements

Enumerator
SIDES_PER_MODULE 
NUMBER_OF_MODULES 
NUMBER_OF_WAFERS 
CHIPS_PER_SIDE 
CHIPS_PER_MODULE 
STRIPS_PER_WAFER 
STRIPS_PER_CHIP 

Definition at line 18 of file SCT_ConditionsParameters.h.

SCT_ConditionsData::ECC
@ ECC
Definition: SCT_ConditionsParameters.h:27
SCT_ConditionsData::N_REGIONS
@ N_REGIONS
Definition: SCT_ConditionsParameters.h:28
SCT_ConditionsData::NUMBER_OF_MODULES
@ NUMBER_OF_MODULES
Definition: SCT_ConditionsParameters.h:19
SCT_ConditionsData::CHIPS_PER_SIDE
@ CHIPS_PER_SIDE
Definition: SCT_ConditionsParameters.h:20
SCT_ConditionsData::bec_ECA
@ bec_ECA
Definition: SCT_ConditionsParameters.h:31
SCT_ConditionsData::bec_BARREL
@ bec_BARREL
Definition: SCT_ConditionsParameters.h:31
SCT_ConditionsData::SIDES_PER_MODULE
@ SIDES_PER_MODULE
Definition: SCT_ConditionsParameters.h:18
SCT_ConditionsData::STRIPS_PER_WAFER
@ STRIPS_PER_WAFER
Definition: SCT_ConditionsParameters.h:21
SCT_ConditionsData::N_NPTGAIN
@ N_NPTGAIN
Definition: SCT_ConditionsParameters.h:22
SCT_ConditionsData::N_NOISEOCC
@ N_NOISEOCC
Definition: SCT_ConditionsParameters.h:22
SCT_ConditionsData::INDEX_HVfraction
@ INDEX_HVfraction
Definition: SCT_ConditionsParameters.h:29
SCT_ConditionsData::STRIPS_PER_CHIP
@ STRIPS_PER_CHIP
Definition: SCT_ConditionsParameters.h:21
SCT_ConditionsData::bec_ECC
@ bec_ECC
Definition: SCT_ConditionsParameters.h:31
SCT_ConditionsData::ECA
@ ECA
Definition: SCT_ConditionsParameters.h:26
SCT_ConditionsData::NUMBER_OF_WAFERS
@ NUMBER_OF_WAFERS
Definition: SCT_ConditionsParameters.h:19
SCT_ConditionsData::OVERALL
@ OVERALL
Definition: SCT_ConditionsParameters.h:24
SCT_ConditionsData::HighAndLowVoltageOK
@ HighAndLowVoltageOK
Definition: SCT_ConditionsParameters.h:23
SCT_ConditionsData::INDEX_MajorityState
@ INDEX_MajorityState
Definition: SCT_ConditionsParameters.h:30
BARREL
@ BARREL
Definition: TRTRadiatorParameters.h:10
SCT_ConditionsData::CHIPS_PER_MODULE
@ CHIPS_PER_MODULE
Definition: SCT_ConditionsParameters.h:20