ATLAS Offline Software
InnerDetector
InDetConditions
SCT_ConditionsData
SCT_ConditionsData
SCT_ConditionsParameters.h
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// -*- C++ -*-
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/*
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Copyright (C) 2002-2020 CERN for the benefit of the ATLAS collaboration
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*/
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#ifndef SCT_CONDITIONSDATA_SCT_CONDITIONSPARAMETERS_H
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#define SCT_CONDITIONSDATA_SCT_CONDITIONSPARAMETERS_H
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namespace
SCT_ConditionsData
{
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enum
NumberOfElements
{
SIDES_PER_MODULE
=2,
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NUMBER_OF_MODULES
=4088,
NUMBER_OF_WAFERS
=
NUMBER_OF_MODULES
*
SIDES_PER_MODULE
,
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CHIPS_PER_SIDE
=6,
CHIPS_PER_MODULE
=
SIDES_PER_MODULE
*
CHIPS_PER_SIDE
,
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STRIPS_PER_WAFER
=768,
STRIPS_PER_CHIP
=
STRIPS_PER_WAFER
/
CHIPS_PER_SIDE
};
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enum
NumberOfCalibrationData
{
N_NPTGAIN
=6,
N_NOISEOCC
=4};
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enum
MajorityParameters
{
HighAndLowVoltageOK
=17,
/* 17 = 0x11 -> majority state for both LV and HV. */
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OVERALL
=110,
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BARREL
=111,
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ECA
=114,
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ECC
=115,
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N_REGIONS
=4,
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INDEX_HVfraction
=1,
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INDEX_MajorityState
=3};
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enum
Bec
{
bec_ECC
=-2,
bec_BARREL
=0,
bec_ECA
=+2};
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}
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#endif // SCT_CONDITIONSDATA_SCT_CONDITIONSPARAMETERS_H
SCT_ConditionsData::MajorityParameters
MajorityParameters
Definition:
SCT_ConditionsParameters.h:23
SCT_ConditionsData::ECC
@ ECC
Definition:
SCT_ConditionsParameters.h:27
SCT_ConditionsData::N_REGIONS
@ N_REGIONS
Definition:
SCT_ConditionsParameters.h:28
SCT_ConditionsData::NUMBER_OF_MODULES
@ NUMBER_OF_MODULES
Definition:
SCT_ConditionsParameters.h:19
SCT_ConditionsData::CHIPS_PER_SIDE
@ CHIPS_PER_SIDE
Definition:
SCT_ConditionsParameters.h:20
SCT_ConditionsData::NumberOfElements
NumberOfElements
Definition:
SCT_ConditionsParameters.h:18
SCT_ConditionsData::bec_ECA
@ bec_ECA
Definition:
SCT_ConditionsParameters.h:31
SCT_ConditionsData::NumberOfCalibrationData
NumberOfCalibrationData
Definition:
SCT_ConditionsParameters.h:22
SCT_ConditionsData::bec_BARREL
@ bec_BARREL
Definition:
SCT_ConditionsParameters.h:31
SCT_ConditionsData::SIDES_PER_MODULE
@ SIDES_PER_MODULE
Definition:
SCT_ConditionsParameters.h:18
SCT_ConditionsData::STRIPS_PER_WAFER
@ STRIPS_PER_WAFER
Definition:
SCT_ConditionsParameters.h:21
SCT_ConditionsData::N_NPTGAIN
@ N_NPTGAIN
Definition:
SCT_ConditionsParameters.h:22
SCT_ConditionsData::N_NOISEOCC
@ N_NOISEOCC
Definition:
SCT_ConditionsParameters.h:22
SCT_ConditionsData::INDEX_HVfraction
@ INDEX_HVfraction
Definition:
SCT_ConditionsParameters.h:29
SCT_ConditionsData::STRIPS_PER_CHIP
@ STRIPS_PER_CHIP
Definition:
SCT_ConditionsParameters.h:21
SCT_ConditionsData::bec_ECC
@ bec_ECC
Definition:
SCT_ConditionsParameters.h:31
SCT_ConditionsData::ECA
@ ECA
Definition:
SCT_ConditionsParameters.h:26
SCT_ConditionsData::NUMBER_OF_WAFERS
@ NUMBER_OF_WAFERS
Definition:
SCT_ConditionsParameters.h:19
SCT_ConditionsData
Definition:
SCT_ConditionsParameters.h:17
SCT_ConditionsData::BARREL
@ BARREL
Definition:
SCT_ConditionsParameters.h:25
SCT_ConditionsData::OVERALL
@ OVERALL
Definition:
SCT_ConditionsParameters.h:24
SCT_ConditionsData::HighAndLowVoltageOK
@ HighAndLowVoltageOK
Definition:
SCT_ConditionsParameters.h:23
SCT_ConditionsData::INDEX_MajorityState
@ INDEX_MajorityState
Definition:
SCT_ConditionsParameters.h:30
SCT_ConditionsData::Bec
Bec
Definition:
SCT_ConditionsParameters.h:31
SCT_ConditionsData::CHIPS_PER_MODULE
@ CHIPS_PER_MODULE
Definition:
SCT_ConditionsParameters.h:20
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