SCT_ChargeTrappinTool Class Reference

#include <SCT_ChargeTrappingTool.h>

Collaboration diagram for SCT_ChargeTrappinTool:

Detailed Description

Concrete class for tool providing quantities related to radiation damage effects for each detector element: 1) Mean Free Path assuming exponential loss of charge - dependent on Fluence 2) Electric Field dependent on Bias voltage and Fluence

Definition at line 36 of file SCT_ChargeTrappingTool.h.

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The documentation for this class was generated from the following file:

• SCT_ChargeTrappingTool.h