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SCT_ReadCalibChipDataTool Class Reference

This class contains a Tool that reads SCT calibration data and makes it available to other algorithms. More...

#include <SCT_ReadCalibChipDataTool.h>

Inheritance diagram for SCT_ReadCalibChipDataTool:
Collaboration diagram for SCT_ReadCalibChipDataTool:

Public Member Functions

 SCT_ReadCalibChipDataTool (const std::string &type, const std::string &name, const IInterface *parent)
 Constructor. More...
 
virtual ~SCT_ReadCalibChipDataTool ()=default
 Destructor. More...
 
virtual StatusCode initialize () override
 Gaudi initialiser. More...
 
virtual StatusCode finalize () override
 Gaudi finaliser. More...
 

Methods to be implemented from virtual baseclass methods, when introduced

Return whether this service can report on the hierarchy level (e.g.

module, chip...)

enum  FolderType { NPTGAIN, NOISEOCC, UNKNOWN_FOLDER, N_FOLDERTYPES }
 
const SCT_ID * m_id_sct {nullptr}
 Handle to SCT ID helper. More...
 
SG::ReadCondHandleKey< SCT_GainCalibData > m_condKeyGain {this, "CondKeyGain", "SCT_GainCalibData", "SCT calibration data of gains of chips"}
 
SG::ReadCondHandleKey< SCT_NoiseCalibData > m_condKeyNoise {this, "CondKeyNoise", "SCT_NoiseCalibData", "SCT calibration data of noises of chips"}
 
FloatProperty m_noiseLevel {this, "NoiseLevel", 1800.0, "Noise Level for isGood if ever used"}
 
virtual bool canReportAbout (InDetConditions::Hierarchy h) const override
 
virtual bool isGood (const Identifier &elementId, const EventContext &ctx, InDetConditions::Hierarchy h=InDetConditions::DEFAULT) const override
 Summarise the result from the service as good/bad. More...
 
virtual bool isGood (const Identifier &elementId, InDetConditions::Hierarchy h=InDetConditions::DEFAULT) const override
 
virtual bool isGood (const IdentifierHash &hashId, const EventContext &ctx) const override
 same thing with id hash, introduced by shaun with dummy method for now More...
 
virtual bool isGood (const IdentifierHash &hashId) const override
 
virtual void getDetectorElementStatus (const EventContext &ctx, InDet::SiDetectorElementStatus &element_status, SG::WriteCondHandle< InDet::SiDetectorElementStatus > *whandle) const override
 
virtual std::vector< float > getNPtGainData (const Identifier &moduleId, const int side, const std::string &datatype, const EventContext &ctx) const override
 Get NPtGain data per wafer. More...
 
virtual std::vector< float > getNPtGainData (const Identifier &moduleId, const int side, const std::string &datatype) const override
 Get NPtGain data per wafer. More...
 
virtual std::vector< float > getNoiseOccupancyData (const Identifier &moduleId, const int side, const std::string &datatype, const EventContext &ctx) const override
 Get NoiseOccupancy data wafer. More...
 
virtual std::vector< float > getNoiseOccupancyData (const Identifier &moduleId, const int side, const std::string &datatype) const override
 Get NoiseOccupancy data wafer. More...
 
static int nPtGainIndex (const std::string &dataName)
 
static int noiseOccIndex (const std::string &dataName)
 
const SCT_GainCalibData * getCondDataGain (const EventContext &ctx) const
 
const SCT_NoiseCalibData * getCondDataNoise (const EventContext &ctx) const
 

Detailed Description

This class contains a Tool that reads SCT calibration data and makes it available to other algorithms.

The current implementation reads the data from a COOL database.

Definition at line 34 of file SCT_ReadCalibChipDataTool.h.

Member Enumeration Documentation

◆ FolderType

enum SCT_ReadCalibChipDataTool::FolderType
private
Enumerator
NPTGAIN 
NOISEOCC 
UNKNOWN_FOLDER 
N_FOLDERTYPES 

Definition at line 67 of file SCT_ReadCalibChipDataTool.h.

67 {NPTGAIN, NOISEOCC, UNKNOWN_FOLDER, N_FOLDERTYPES};

Constructor & Destructor Documentation

◆ SCT_ReadCalibChipDataTool()

SCT_ReadCalibChipDataTool::SCT_ReadCalibChipDataTool ( const std::string &  type,
const std::string &  name,
const IInterface *  parent 
)

Constructor.

Definition at line 25 of file SCT_ReadCalibChipDataTool.cxx.

25  :
26  base_class(type, name, parent)
27 {
28 }

◆ ~SCT_ReadCalibChipDataTool()

virtual SCT_ReadCalibChipDataTool::~SCT_ReadCalibChipDataTool ( )
virtualdefault

Destructor.

Member Function Documentation

◆ canReportAbout()

bool SCT_ReadCalibChipDataTool::canReportAbout ( InDetConditions::Hierarchy  h) const
overridevirtual

Definition at line 53 of file SCT_ReadCalibChipDataTool.cxx.

53  {
54  return (h==InDetConditions::SCT_SIDE);
55 }

◆ finalize()

StatusCode SCT_ReadCalibChipDataTool::finalize ( )
overridevirtual

Gaudi finaliser.

Definition at line 45 of file SCT_ReadCalibChipDataTool.cxx.

45  {
46  // Print where you are
47  return StatusCode::SUCCESS;
48 } // SCT_ReadCalibChipDataTool::finalize()

◆ getCondDataGain()

const SCT_GainCalibData * SCT_ReadCalibChipDataTool::getCondDataGain ( const EventContext &  ctx) const
private

Definition at line 286 of file SCT_ReadCalibChipDataTool.cxx.

286  {
287  SG::ReadCondHandle<SCT_GainCalibData> condData{m_condKeyGain, ctx};
288  return condData.retrieve();
289 }

◆ getCondDataNoise()

const SCT_NoiseCalibData * SCT_ReadCalibChipDataTool::getCondDataNoise ( const EventContext &  ctx) const
private

Definition at line 292 of file SCT_ReadCalibChipDataTool.cxx.

292  {
293  SG::ReadCondHandle<SCT_NoiseCalibData> condData{m_condKeyNoise, ctx};
294  return condData.retrieve();
295 }

◆ getDetectorElementStatus()

void SCT_ReadCalibChipDataTool::getDetectorElementStatus ( const EventContext &  ctx,
InDet::SiDetectorElementStatus &  element_status,
SG::WriteCondHandle< InDet::SiDetectorElementStatus > *  whandle 
) const
overridevirtual

Definition at line 101 of file SCT_ReadCalibChipDataTool.cxx.

102  {
103  SG::ReadCondHandle<SCT_NoiseCalibData> condDataHandle{m_condKeyNoise, ctx};
104  if (not condDataHandle.isValid() ) {
105  ATH_MSG_ERROR("Invalid cond data handle " << m_condKeyNoise.key() );
106  return;
107  }
108  if (whandle) {
109  whandle->addDependency (condDataHandle);
110  }
111  const SCT_NoiseCalibData* condDataNoise{condDataHandle.cptr() };
112  std::vector<bool> &status = element_status.getElementStatus();
113  if (status.empty()) {
114  status.resize(m_id_sct->wafer_hash_max(),true);
115  }
116  unsigned int element_i=0;
117  for (const SCT_ModuleNoiseCalibData& noiseOccData : *condDataNoise) {
118  const int occ_index{noiseOccIndex("NoiseByChip")};
119  if (occ_index<0) {
120  ATH_MSG_ERROR("This NoiseOccupancy noise data does not exist");
121  return;
122  }
123  const SCT_ModuleCalibParameter& moduleNoiseData{noiseOccData[occ_index]};
124 
125  for (unsigned int side_i=0; side_i<2; ++side_i) {
126  unsigned int chip{side_i*CHIPS_PER_SIDE};
127  const unsigned int endChip{CHIPS_PER_SIDE+chip};
128  unsigned int nChips{0};
129  float sum{0.0};
130 
131  for (; chip!=endChip; ++chip) {
132  float chipNoise{moduleNoiseData[chip]};
133  if (chipNoise!=0.0) {
134  sum+=chipNoise;
135  ++nChips;
136  }
137  }
138  const float meanNoiseValue{ nChips>0 ? sum/nChips : 0.f};
139  status.at(element_i) = status.at(element_i) && (meanNoiseValue < m_noiseLevel);
140 
141  ++element_i;
142  }
143  }
144 }

◆ getNoiseOccupancyData() [1/2]

std::vector< float > SCT_ReadCalibChipDataTool::getNoiseOccupancyData ( const Identifier &  moduleId,
const int  side,
const std::string &  datatype 
) const
overridevirtual

Get NoiseOccupancy data wafer.

Definition at line 266 of file SCT_ReadCalibChipDataTool.cxx.

266  {
267  const EventContext& ctx{Gaudi::Hive::currentContext()};
268  return getNoiseOccupancyData(moduleId, side, datatype, ctx);
269 }

◆ getNoiseOccupancyData() [2/2]

std::vector< float > SCT_ReadCalibChipDataTool::getNoiseOccupancyData ( const Identifier &  moduleId,
const int  side,
const std::string &  datatype,
const EventContext &  ctx 
) const
overridevirtual

Get NoiseOccupancy data wafer.

Definition at line 225 of file SCT_ReadCalibChipDataTool.cxx.

225  {
226  // Print where you are
227  ATH_MSG_DEBUG("in getNoiseOccupancyData()");
228  std::vector<float> waferData;
229 
230  // Retrieve SCT_NoiseCalibData pointer
231  const SCT_NoiseCalibData* condDataNoise{getCondDataNoise(ctx)};
232  if (condDataNoise==nullptr) {
233  ATH_MSG_ERROR("In getNPtNoiseData, SCT_NoiseCalibData cannot be retrieved");
234  return waferData;
235  }
236 
237  //find hash
238  const IdentifierHash hashId{m_id_sct->wafer_hash(moduleId)};
239  //make index
240  const unsigned int idx{hashId/SIDES_PER_MODULE};
241  try {
242  //Retrieve defect data from array
243  const SCT_ModuleNoiseCalibData& wantedNoiseData{condDataNoise->at(idx)};
244 
245  //find the correct index for the required data
246  const int dataIdx{noiseOccIndex(datatype)};
247  if (dataIdx<0) {
248  ATH_MSG_ERROR("This Noise Occupancy data: " << datatype << " does not exist");
249  return waferData;
250  }
251  const SCT_ModuleCalibParameter& moduleNoise{wantedNoiseData[dataIdx]};
252  const int startOffset{side*CHIPS_PER_SIDE};
253  const int endOffset{CHIPS_PER_SIDE+startOffset};
254  SCT_ModuleCalibParameter::const_iterator it{moduleNoise.begin() + startOffset};
255  SCT_ModuleCalibParameter::const_iterator end{moduleNoise.begin() + endOffset};
256  // Returns the data for the wanted wafer
257  if (*it != *it) return waferData;
258  waferData.assign(it, end);
259  return waferData;
260  } catch (const std::out_of_range& e) {
261  return waferData;
262  }
263 } // SCT_ReadCalibChipDataTool::getNoiseOccupancyData()

◆ getNPtGainData() [1/2]

std::vector< float > SCT_ReadCalibChipDataTool::getNPtGainData ( const Identifier &  moduleId,
const int  side,
const std::string &  datatype 
) const
overridevirtual

Get NPtGain data per wafer.

Definition at line 218 of file SCT_ReadCalibChipDataTool.cxx.

218  {
219  const EventContext& ctx{Gaudi::Hive::currentContext()};
220  return getNPtGainData(moduleId, side, datatype, ctx);
221 }

◆ getNPtGainData() [2/2]

std::vector< float > SCT_ReadCalibChipDataTool::getNPtGainData ( const Identifier &  moduleId,
const int  side,
const std::string &  datatype,
const EventContext &  ctx 
) const
overridevirtual

Get NPtGain data per wafer.

Definition at line 176 of file SCT_ReadCalibChipDataTool.cxx.

176  {
177  // Print where you are
178  ATH_MSG_DEBUG("in getNPtGainData()");
179  std::vector<float> waferData;
180 
181  // Retrieve SCT_GainCalibData pointer
182  const SCT_GainCalibData* condDataGain{getCondDataGain(ctx)};
183  if (condDataGain==nullptr) {
184  ATH_MSG_ERROR("In getNPtGainData, SCT_GainCalibData cannot be retrieved");
185  return waferData;
186  }
187 
188  //find hash
189  const IdentifierHash hashId{m_id_sct->wafer_hash(moduleId)};
190  //make index
191  const unsigned int idx{hashId/SIDES_PER_MODULE};
192  //Retrieve defect data from map
193  try {
194  const SCT_ModuleGainCalibData& wantedNPGData{condDataGain->at(idx)};
195  //find the correct index for the required data
196  const int dataIdx{nPtGainIndex(datatype)};
197  if (dataIdx<0) {
198  ATH_MSG_ERROR("This N-point gain data: " << datatype << " does not exist");
199  return waferData;
200  }
201  const SCT_ModuleCalibParameter& moduleGains{wantedNPGData[dataIdx]};
202  const int startOffset{side*CHIPS_PER_SIDE};
203  const int endOffset{CHIPS_PER_SIDE+startOffset};
204  SCT_ModuleCalibParameter::const_iterator it{moduleGains.begin() + startOffset};
205  SCT_ModuleCalibParameter::const_iterator end{moduleGains.begin() + endOffset};
206  // Returns the data for the wanted wafer
207  if (*it != *it) return waferData;
208  //could use signaling NaN here and catch the exception instead, would be quicker: NO!
209  //see: http://stackoverflow.com/questions/235386/using-nan-in-c
210  waferData.assign(it, end);
211  return waferData;
212  } catch (const std::out_of_range& e) {
213  return waferData;
214  }
215 } //SCT_ReadCalibChipDataTool::getNPtGainData()

◆ initialize()

StatusCode SCT_ReadCalibChipDataTool::initialize ( )
overridevirtual

Gaudi initialiser.

Definition at line 32 of file SCT_ReadCalibChipDataTool.cxx.

32  {
33  // Get SCT helper
34  ATH_CHECK(detStore()->retrieve(m_id_sct, "SCT_ID"));
35 
36  // Read Cond Handle Key
37  ATH_CHECK(m_condKeyGain.initialize());
38  ATH_CHECK(m_condKeyNoise.initialize());
39 
40  return StatusCode::SUCCESS;
41 } // SCT_ReadCalibChipDataTool::initialize()

◆ isGood() [1/4]

bool SCT_ReadCalibChipDataTool::isGood ( const Identifier &  elementId,
const EventContext &  ctx,
InDetConditions::Hierarchy  h = InDetConditions::DEFAULT 
) const
overridevirtual

Summarise the result from the service as good/bad.

Definition at line 156 of file SCT_ReadCalibChipDataTool.cxx.

156  {
157  if (h==InDetConditions::SCT_SIDE) { //Could do by chip too
158  const IdentifierHash elementIdHash{m_id_sct->wafer_hash(elementId)};
159  return isGood(elementIdHash, ctx);
160  } else{
161  // Not applicable for Calibration data
162  ATH_MSG_WARNING("summary(): " << h << "good/bad is not applicable for Calibration data");
163  return true;
164  }
165 }

◆ isGood() [2/4]

bool SCT_ReadCalibChipDataTool::isGood ( const Identifier &  elementId,
InDetConditions::Hierarchy  h = InDetConditions::DEFAULT 
) const
overridevirtual

Definition at line 168 of file SCT_ReadCalibChipDataTool.cxx.

168  {
169  const EventContext& ctx{Gaudi::Hive::currentContext()};
170 
171  return isGood(elementId, ctx, h);
172 }

◆ isGood() [3/4]

bool SCT_ReadCalibChipDataTool::isGood ( const IdentifierHash &  hashId) const
overridevirtual

Definition at line 147 of file SCT_ReadCalibChipDataTool.cxx.

147  {
148  const EventContext& ctx{Gaudi::Hive::currentContext()};
149 
150  return isGood(elementHashId, ctx);
151 }

◆ isGood() [4/4]

bool SCT_ReadCalibChipDataTool::isGood ( const IdentifierHash &  hashId,
const EventContext &  ctx 
) const
overridevirtual

same thing with id hash, introduced by shaun with dummy method for now

Definition at line 60 of file SCT_ReadCalibChipDataTool.cxx.

60  {
61  // Retrieve SCT_NoiseCalibData pointer
62  const SCT_NoiseCalibData* condDataNoise{getCondDataNoise(ctx)};
63  if (condDataNoise==nullptr) {
64  ATH_MSG_ERROR("In isGood, SCT_NoiseCalibData cannot be retrieved");
65  return true;
66  }
67 
68  const unsigned int moduleIdx{elementHashId/SIDES_PER_MODULE};
69  // Retrieve defect data from map
70  const SCT_ModuleNoiseCalibData& noiseOccData{(*condDataNoise)[moduleIdx]};
71 
72  // Retrieve the data
73  const int i{noiseOccIndex("NoiseByChip")};
74  if (i<0) {
75  ATH_MSG_ERROR("This NoiseOccupancy noise data does not exist");
76  return true;
77  }
78  const SCT_ModuleCalibParameter& moduleNoiseData{noiseOccData[i]};
79 
80  // Calcuate module status
81  // For now just simple check NO mean noise level
82  // Chip could be 0 if bypassed, need to check
83  const int side{static_cast<int>(elementHashId%2)};
84  int chip{side*CHIPS_PER_SIDE};
85  const int endChip{CHIPS_PER_SIDE+chip};
86  int nChips{0};
87  float sum{0.0};
88  for (; chip!=endChip; ++chip) {
89  float chipNoise{moduleNoiseData[chip]};
90  if (chipNoise!=0.0) {
91  sum+=chipNoise;
92  ++nChips;
93  }
94  }
95  const float meanNoiseValue{sum/nChips};
96  ATH_MSG_DEBUG("Module mean noise: " << meanNoiseValue);
97  return (meanNoiseValue < m_noiseLevel);
98 } //SCT_ReadCalibChipDataTool::summary()

◆ noiseOccIndex()

int SCT_ReadCalibChipDataTool::noiseOccIndex ( const std::string &  dataName)
staticprivate

Definition at line 279 of file SCT_ReadCalibChipDataTool.cxx.

279  {
280  int i{N_NOISEOCC};
281  while (i--) if (dataName==noiseOccParameterNames[i]) break;
282  return i;
283 }

◆ nPtGainIndex()

int SCT_ReadCalibChipDataTool::nPtGainIndex ( const std::string &  dataName)
staticprivate

Definition at line 272 of file SCT_ReadCalibChipDataTool.cxx.

272  {
273  int i{N_NPTGAIN};
274  while (i--) if (dataName==nPtGainParameterNames[i]) break;
275  return i;
276 }

Member Data Documentation

◆ m_condKeyGain

SG::ReadCondHandleKey<SCT_GainCalibData> SCT_ReadCalibChipDataTool::m_condKeyGain {this, "CondKeyGain", "SCT_GainCalibData", "SCT calibration data of gains of chips"}
private

Definition at line 80 of file SCT_ReadCalibChipDataTool.h.

◆ m_condKeyNoise

SG::ReadCondHandleKey<SCT_NoiseCalibData> SCT_ReadCalibChipDataTool::m_condKeyNoise {this, "CondKeyNoise", "SCT_NoiseCalibData", "SCT calibration data of noises of chips"}
private

Definition at line 81 of file SCT_ReadCalibChipDataTool.h.

◆ m_id_sct

const SCT_ID* SCT_ReadCalibChipDataTool::m_id_sct {nullptr}
private

Handle to SCT ID helper.

Definition at line 77 of file SCT_ReadCalibChipDataTool.h.

◆ m_noiseLevel

FloatProperty SCT_ReadCalibChipDataTool::m_noiseLevel {this, "NoiseLevel", 1800.0, "Noise Level for isGood if ever used"}
private

Definition at line 84 of file SCT_ReadCalibChipDataTool.h.

The documentation for this class was generated from the following files:
python.PyKernel.retrieve
def retrieve(aClass, aKey=None)
Definition: PyKernel.py:110
AllowedVariables::e
e
Definition: AsgElectronSelectorTool.cxx:37
SCT_ModuleNoiseCalibData
std::array< SCT_ModuleCalibParameter, SCT_ConditionsData::N_NOISEOCC > SCT_ModuleNoiseCalibData
Typedef for data object used in SCT_ReadCalibChipNoiseCondAlg and SCT_ReadCalibChipDataTool.
Definition: SCT_ModuleNoiseCalibData.h:26
SCT_ReadCalibChipDataTool::isGood
virtual bool isGood(const Identifier &elementId, const EventContext &ctx, InDetConditions::Hierarchy h=InDetConditions::DEFAULT) const override
Summarise the result from the service as good/bad.
Definition: SCT_ReadCalibChipDataTool.cxx:156
SCT_NoiseCalibData
std::array< SCT_ModuleNoiseCalibData, SCT_ConditionsData::NUMBER_OF_MODULES > SCT_NoiseCalibData
Class for data object used in SCT_ReadCalibChipNoiseCondAlg and SCT_ReadCalibChipDataTool.
Definition: SCT_NoiseCalibData.h:26
InDet::SiDetectorElementStatus::getElementStatus
const std::vector< bool > & getElementStatus() const
Definition: SiDetectorElementStatus.h:116
SG::ReadCondHandle
Definition: ReadCondHandle.h:44
SCT_ConditionsData::CHIPS_PER_SIDE
@ CHIPS_PER_SIDE
Definition: SCT_ConditionsParameters.h:20
SCT_ReadCalibChipDataTool::NPTGAIN
@ NPTGAIN
Definition: SCT_ReadCalibChipDataTool.h:67
skel.it
it
Definition: skel.GENtoEVGEN.py:396
SCT_ConditionsData::SIDES_PER_MODULE
@ SIDES_PER_MODULE
Definition: SCT_ConditionsParameters.h:18
SCT_ConditionsData::N_NPTGAIN
@ N_NPTGAIN
Definition: SCT_ConditionsParameters.h:22
SCT_ConditionsData::N_NOISEOCC
@ N_NOISEOCC
Definition: SCT_ConditionsParameters.h:22
SG::VarHandleKey::key
const std::string & key() const
Return the StoreGate ID for the referenced object.
Definition: AthToolSupport/AsgDataHandles/Root/VarHandleKey.cxx:141
mergePhysValFiles.end
end
Definition: DataQuality/DataQualityUtils/scripts/mergePhysValFiles.py:93
TRT::Hit::side
@ side
Definition: HitInfo.h:83
SCT_ReadCalibChipDataTool::getNoiseOccupancyData
virtual std::vector< float > getNoiseOccupancyData(const Identifier &moduleId, const int side, const std::string &datatype, const EventContext &ctx) const override
Get NoiseOccupancy data wafer.
Definition: SCT_ReadCalibChipDataTool.cxx:225
SCT_ReadCalibChipDataTool::getCondDataNoise
const SCT_NoiseCalibData * getCondDataNoise(const EventContext &ctx) const
Definition: SCT_ReadCalibChipDataTool.cxx:292
SCT_ReadCalibChipDataTool::UNKNOWN_FOLDER
@ UNKNOWN_FOLDER
Definition: SCT_ReadCalibChipDataTool.h:67
ATH_MSG_ERROR
#define ATH_MSG_ERROR(x)
Definition: AthMsgStreamMacros.h:33
convertTimingResiduals.sum
sum
Definition: convertTimingResiduals.py:55
SCT_ReadCalibChipDataTool::N_FOLDERTYPES
@ N_FOLDERTYPES
Definition: SCT_ReadCalibChipDataTool.h:67
lumiFormat.i
int i
Definition: lumiFormat.py:85
h
SCT_ModuleCalibParameter
std::array< float, SCT_ConditionsData::CHIPS_PER_MODULE > SCT_ModuleCalibParameter
typedef for SCT_ReadCalibChipGainCondAlg, SCT_ReadCalibChipNoiseCondAlg, SCT_ReadCalibChipDataTool.
Definition: SCT_ModuleCalibParameter.h:27
ATH_MSG_DEBUG
#define ATH_MSG_DEBUG(x)
Definition: AthMsgStreamMacros.h:29
test_pyathena.parent
parent
Definition: test_pyathena.py:15
ATH_CHECK
#define ATH_CHECK
Definition: AthCheckMacros.h:40
SCT_ModuleGainCalibData
std::array< SCT_ModuleCalibParameter, SCT_ConditionsData::N_NPTGAIN > SCT_ModuleGainCalibData
Typedef for data object used in SCT_ReadCalibChipGainCondAlg and SCT_ReadCalibChipDataTool.
Definition: SCT_ModuleGainCalibData.h:26
SCT_ID::wafer_hash
IdentifierHash wafer_hash(const Identifier &wafer_id) const
wafer hash from id - optimized
Definition: SCT_ID.h:492
SCT_ReadCalibChipDataTool::m_condKeyGain
SG::ReadCondHandleKey< SCT_GainCalibData > m_condKeyGain
Definition: SCT_ReadCalibChipDataTool.h:80
SCT_ReadCalibChipDataTool::nPtGainIndex
static int nPtGainIndex(const std::string &dataName)
Definition: SCT_ReadCalibChipDataTool.cxx:272
python.PyKernel.detStore
detStore
Definition: PyKernel.py:41
SCT_ReadCalibChipDataTool::NOISEOCC
@ NOISEOCC
Definition: SCT_ReadCalibChipDataTool.h:67
SCT_ReadCalibChipDefs::noiseOccParameterNames
const std::array< std::string, SCT_ConditionsData::N_NOISEOCC > noiseOccParameterNames
Definition: SCT_ReadCalibChipDefs.h:24
name
std::string name
Definition: Control/AthContainers/Root/debug.cxx:228
SCT_ID::wafer_hash_max
size_type wafer_hash_max(void) const
Definition: SCT_ID.cxx:645
SG::CondHandleKey::initialize
StatusCode initialize(bool used=true)
SCT_ReadCalibChipDataTool::getNPtGainData
virtual std::vector< float > getNPtGainData(const Identifier &moduleId, const int side, const std::string &datatype, const EventContext &ctx) const override
Get NPtGain data per wafer.
Definition: SCT_ReadCalibChipDataTool.cxx:176
SCT_ReadCalibChipDataTool::m_condKeyNoise
SG::ReadCondHandleKey< SCT_NoiseCalibData > m_condKeyNoise
Definition: SCT_ReadCalibChipDataTool.h:81
SCT_ReadCalibChipDataTool::noiseOccIndex
static int noiseOccIndex(const std::string &dataName)
Definition: SCT_ReadCalibChipDataTool.cxx:279
SCT_ReadCalibChipDefs::nPtGainParameterNames
const std::array< std::string, SCT_ConditionsData::N_NPTGAIN > nPtGainParameterNames
Definition: SCT_ReadCalibChipDefs.h:18
SCT_ReadCalibChipDataTool::getCondDataGain
const SCT_GainCalibData * getCondDataGain(const EventContext &ctx) const
Definition: SCT_ReadCalibChipDataTool.cxx:286
ATH_MSG_WARNING
#define ATH_MSG_WARNING(x)
Definition: AthMsgStreamMacros.h:32
SCT_ReadCalibChipDataTool::m_id_sct
const SCT_ID * m_id_sct
Handle to SCT ID helper.
Definition: SCT_ReadCalibChipDataTool.h:77
python.CaloScaleNoiseConfig.type
type
Definition: CaloScaleNoiseConfig.py:78
LArNewCalib_DelayDump_OFC_Cali.idx
idx
Definition: LArNewCalib_DelayDump_OFC_Cali.py:69
merge.status
status
Definition: merge.py:17
InDetConditions::SCT_SIDE
@ SCT_SIDE
Definition: InDetHierarchy.h:14
SCT_ReadCalibChipDataTool::m_noiseLevel
FloatProperty m_noiseLevel
Definition: SCT_ReadCalibChipDataTool.h:84
SCT_GainCalibData
std::array< SCT_ModuleGainCalibData, SCT_ConditionsData::NUMBER_OF_MODULES > SCT_GainCalibData
Typedef for data object used in SCT_ReadCalibChipGainCondAlg and SCT_ReadCalibChipDataTool.
Definition: SCT_GainCalibData.h:26
SG::WriteCondHandle::addDependency
void addDependency(const EventIDRange &range)
Definition: WriteCondHandle.h:275
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